Optical near-field electron microscopy

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Raphaël Marchand; Radek Šachl; Martin Kalbáč; Martin Hof; Rudolf Tromp; Mariana Amaro; Sense J. van der Molen; Thomas Juffmann

Journal title: Physical Review Applied

Journal number: 16

Journal publisher: American Physical Society

Published year: 2021

Published pages: 014008

DOI identifier: 10.1103/physrevapplied.16.014008

ISSN: 2331-7019