Surface analysis insight note: Accounting for X-ray beam damage effects in positive electrode-electrolyte interphase investigations

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Authors: Roberto Fantin, Ambroise Van Roekeghem, Jean-Pascal Rueff, Anass Benayad

Journal title: Surface and interface analysis

Journal publisher: John Wiley & Sons Inc.

Published year: 2024

DOI identifier: 10.1002/sia.7294

ISSN: 0142-2421