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Authors: B.A.C. van de Ven; R.W.H. Sneijders; F.S.J. Hoekstra; H.J. Bergveld; M.C.F. Donkers
Journal title: Proceedings of the 2022 American Control Conference
Journal number: June 2022
Journal publisher: IEEE
Published year: 2022
DOI identifier: 10.23919/acc53348.2022.9867694