One Size Does Not Fit All - Badge Behavior in Q&A Sites

Summary

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Authors: Stav Yanovsky, Nicholas Hoernle, Omer Lev, Kobi Gal

Journal title: Proceedings of the 27th ACM Conference on User Modeling, Adaptation and Personalization - UMAP '19

Journal publisher: ACM Press

Published year: 2019

Published pages: 113-120

DOI identifier: 10.1145/3320435.3320438

ISBN: 9781-450360210