Compact Modelling of 22nm FDSOI CMOS Semiconductor Quantum Dot Cryogenic I-V Characteristics

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Authors: S. Pati Tripathi, S. Bonen, C. Nastase, S. Iordănescu, G. Boldeiu, M. Păşteanu, A. Müller, S. P. Voinigescu

Journal title: ESSCIRC 2021 - IEEE 47th European Solid State Circuits Conference (ESSCIRC)

Journal publisher: IEEE

Published year: 2021

DOI identifier: 10.1109/esscirc53450.2021.9567759