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Authors: S. Bonen, U. Alakusu, Y. Duan, M. J. Gong, M. S. Dadash, L. Lucci, D. R. Daughton, G. C. Adam, S. Iordanescu, M. Pasteanu, I. Giangu, H. Jia, L. E. Gutierrez, W. T. Chen, N. Messaoudi, D. Harame, A. Muller, R. R. Mansour, P. Asbeck, S. P. Voinigescu
Journal title: IEEE Electron Device Letters
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2019
Published pages: 1-1
DOI identifier: 10.1109/led.2018.2880303
ISSN: 0741-3106
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