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Authors: Yogeenth Kumaresan, Nivasan Yogeswaran, Ravinder Dahiya
Journal title: 2020 IEEE Latin America Electron Devices Conference (LAEDC)
Journal publisher: IEEE
Published year: 2020
Published pages: 1-4
DOI identifier: 10.1109/laedc49063.2020.9073550
ISBN: 978-1-7281-1044-8
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