Device simulations of ion-sensitive FETs with arbitrary surface chemical reactions

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Authors: Leandro Julian Mele Pierpaolo Palestri Luca Selmi

Journal title: IEEE Xplore

Journal publisher: IEEE

Published year: 2021

Published pages: pp. 1-4

DOI identifier: 10.1109/eurosoi-ulis53016.2021.9560696

ISBN: 978-1-6654-3746-2