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Authors: Sinem Aslan, Luc Steels
Journal title: Alberto Del Bimbo, Rita Cucchiara, Stan Sclaroff, Giovanni Maria Farinella, Tao Mei, Marco Bertini, Hugo Jair Escalante and Roberto Vezzani (eds.). Pattern Recognition. ICPR International Workshops and Challenges.
Journal publisher: Springer, Cham
Published year: 2021
Published pages: 589–603
DOI identifier: 10.1007/978-3-030-68796-0_42
ISBN: 978-3-030-68796-0