TEMPO: Thermal-Efficient Management of Power in High-Throughput Network Switches

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Authors: Tom Munk; Hillel Kugler; Ofir Maori; Adam Teman

Journal title: 2019 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)

Journal publisher: IEEE

Published year: 2019

Published pages: 1-4

DOI identifier: 10.1109/vlsi-dat.2019.8741684

ISBN: 978-1-7281-0655-7