Superimposed in-circuit debugging for self-healing FPGA overlays

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Authors: Alexandra Kourfali, Dirk Stroobandt

Journal title: 2018 IEEE 19th Latin-American Test Symposium (LATS)

Journal publisher: IEEE

Published year: 2018

Published pages: 1-6

DOI identifier: 10.1109/LATW.2018.8349688

ISBN: 978-1-5386-1472-3