In Situ Force Microscopy to Investigate Fracture in Stretchable Electronics: Insights on Local Surface Mechanics and Conductivity

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Authors: Giorgio Cortelli; Luca Patruno; Tobias Cramer; Beatrice Fraboni; Stefano de Miranda

Journal title: ACS Applied Electronic Materials

Journal publisher: ACS Publications

Published year: 2022

DOI identifier: 10.1021/acsaelm.2c00328

ISSN: 2637-6113