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Authors: Elisabetta Corti, Bernd Gotsmann, Kirsten Moselund, Igor Stolichnov, Adrian Ionescu, Guofang Zhong, John Robertson, Siegfried Karg
Journal title: 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)
Journal publisher: IEEE
Published year: 2019
Published pages: 1-4
DOI identifier: 10.1109/eurosoi-ulis45800.2019.9041875
ISBN: 978-1-7281-1658-7
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