Band alignment calculation of dielectric films on VO2

Summary

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Authors: Zhaofu Zhang, Jiaqi Chen, Yuzheng Guo, John Robertson

Journal title: Microelectronic Engineering

Journal number: 216

Journal publisher: Elsevier BV

Published year: 2019

Published pages: 111057

DOI identifier: 10.1016/j.mee.2019.111057

ISSN: 0167-9317