Long-Term Degradation Mechanisms in Application-Implemented Radical Thin Films

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Authors: E. M Nowik-Boltyk, T, Junghoefer, M. Glaser, E. Giangrisostomi, R. Ovsyannikov, S. Zhang, C. Shu, A. Rajca, A. Calzolari, M. B. Casu

Journal title: ACS Applied Material Interface (open access)

Journal number: volume15, number 25

Journal publisher: American Chemical Society

Published year: 2023

Published pages: 30935–30943

DOI identifier: 10.1021/acsami.3c02057

ISSN: 1944-8252