A first-principle assessment at atomistic scale of interface phenomena in down-scaling hafnium-based metal-insulator-metal diodes

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Authors: Laudadio, Emiliano; Aldrigo, Martino; Stipa, Pierluigi; Pierantoni, Luca; Mencarelli, Davide; Dragoman, Mircea; Modreanu, Mircea

Journal title: EEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO)

Journal number: 2

Journal publisher: IEEE

Published year: 2022

DOI identifier: 10.1109/NEMO51452.2022.10038975

ISSN: 2169-3536