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Authors: M. Aldrigo, M. Dragoman, S. Iordanescu, D. Vasilache, A. Dinescu, G. Biagetti, L. Pierantoni, D Mencarelli
Journal title: 2021 IEEE MTT-S International Microwave Symposium (IMS)
Journal publisher: IEEE
Published year: 2021
DOI identifier: 10.1109/ims19712.2021.9574815
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