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Authors: Evangelos Vasilakis, Vassilis Papaefstathiou, Pedro Trancoso, Ioannis Sourdis
Journal title: 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Journal publisher: IEEE
Published year: 2018
Published pages: 593-596
DOI identifier: 10.23919/date.2018.8342077
ISBN: 978-3-9819263-0-9
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