Summary
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Authors: V. A. Sevriuk, K. Y. Tan, E. Hyyppä, M. Silveri, M. Partanen, M. Jenei, S. Masuda, J. Goetz, V. Vesterinen, L. Grönberg, M. Möttönen
Journal title: Applied Physics Letters
Journal number: 115/8
Journal publisher: American Institute of Physics
Published year: 2019
Published pages: 082601
DOI identifier: 10.1063/1.5116659
ISSN: 0003-6951