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Authors: L. Fasolo; C. Barone; M. Borghesi; G. Carapella; A. P. Caricato; I. Carusotto; W. Chung; A. Cian; D. Di Gioacchino; E. Enrico; P. Falferi; M. Faverzani; E. Ferri; G. Filatrella; C. Gatti; A. Giachero; D. Giubertoni; A. Greco; C. Kutlu; A. Leo; C. Ligi; P. Livreri; G. Maccarrone; B. Margesin; G. Maruccio; A. Matlashov; C. Mauro; R. Mezzena; A. G. Monteduro; A. Nucciotti; L. Oberto; S. Pagano; V. Pi
Journal title: IEEE Transanction on Applied Superconductivity
Journal number: 32/4
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2022
DOI identifier: 10.48550/arxiv.2109.14924
ISSN: 1051-8223
- Not specified