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Authors: S. B. Porter, M. Venkatesan, P. Dunne, B. Doudin, K. Rode, J. M. D. Coey
Journal title: IEEE Transactions on Magnetics
Journal number: 53/11
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2017
Published pages: 1-4
DOI identifier: 10.1109/TMAG.2017.2731124
ISSN: 0018-9464