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Authors: K. E. Siewierska, N. Teichert, R. Schafer, J. M. D. Coey
Journal title: IEEE Transactions on Magnetics
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2018
Published pages: 1-4
DOI identifier: 10.1109/TMAG.2018.2869016
ISSN: 0018-9464
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