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Authors: R. Rusev, G. Angelov, I. Ruskova, E. Gieva, D. Nikolov, M. Spasova, M. Hristov, R. Radonov
Journal title: 2021 IEEE 32nd International Conference on Microelectronics (MIEL)
Journal publisher: IEEE
Published year: 2021
Published pages: 93-96
DOI identifier: 10.1109/miel52794.2021.9569053
ISBN: 978-1-6654-4528-3
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