Periodic Reporting for period 3 - SiC nano for PicoGeo (SiC optical nano-strain-meters for pico-detection in Geosciences (SiC nano for picoGeo))

The project aims at the development of a radically new dynamic ground strain measurement technology with an ultra-high resolution of 10-12 that is about two order of magnitude better than the presently available technology. The new technology is based on the high performance...