Periodic Reporting for period 2 - FIBsuperProbes (Focused Ion Beam fabrication of superconducting scanning Probes)

Summary
Our vision is to enable a new era in scanning probe microscopy (SPM), in which nanometer-scale sensing devices – specifically superconducting devices – can be directly patterned on-tip and used to reveal new types of contrast. To realize this vision, we will use focused...
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