Formation of extended thermal etch pits on annealed Ge wafers

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Authors: L. Persichetti, M. Fanfoni, M. De Seta, L. Di Gaspare, L. Ottaviano, C. Goletti, A. Sgarlata

Journal title: Applied Surface Science

Journal number: 462

Journal publisher: Elsevier BV

Published year: 2018

Published pages: 86-94

DOI identifier: 10.1016/j.apsusc.2018.08.075

ISSN: 0169-4332