Atomic-Scale Insights into Semiconductor Heterostructures: From Experimental Three-Dimensional Analysis of the Interface to a Generalized Theory of Interfacial Roughness Scattering

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Authors: T. Grange, S. Mukherjee, G. Capellini, M. Montanari, L. Persichetti, L. Di Gaspare, S. Birner, A. Attiaoui, O. Moutanabbir, M. Virgilio, M. De Seta

Journal title: Physical Review Applied

Journal number: 13/4

Journal publisher: APS

Published year: 2020

DOI identifier: 10.1103/physrevapplied.13.044062

ISSN: 2331-7019