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Authors: Jan van Lunteren, Ronald Luijten, Dionysios Diamantopoulos, Florian Auernhammer, Christoph Hagleitner, Lorenzo Chelini, Stefano Corda, Gagandeep Singh
Journal title: 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Journal publisher: IEEE
Published year: 2019
Published pages: 668-673
DOI identifier: 10.23919/date.2019.8715088
ISBN: 978-3-9819263-2-3
