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Authors: Deepak M. Mathew, Martin Schultheis, Carl C. Rheinlander, Chirag Sudarshan, Christian Weis, Norbert Wehn, Matthias Jung
Journal title: 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Journal publisher: IEEE
Published year: 2018
Published pages: 293-296
DOI identifier: 10.23919/date.2018.8342023
ISBN: 978-3-9819263-0-9
