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Authors: Kira Kraft, Chirag Sudarshan, Deepak M. Mathew, Christian Weis, Norbert Wehn, Matthias Jung
Journal title: 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Journal publisher: IEEE
Published year: 2018
Published pages: 1492-1495
DOI identifier: 10.23919/date.2018.8342249
ISBN: 978-3-9819263-0-9
