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Authors: Luca Pierantoni ; Davide Mencarelli ; Matteo Stocchi
Journal title: Proceedings of the 2017 IEEE MTT-S International Microwave Symposium (IMS)
Journal publisher: IEEE
Published year: 2017
Published pages: 1660 - 1663
DOI identifier: 10.1109/MWSYM.2017.8058956