The next Generation of Exascale-class Systems: the ExaNeSt Project

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Authors: R. Ammendola, A. Biagioni, P. Cretaro, O. Frezza, F. Lo Cicero, A. Lonardo, M. Martinelli, P. S. Paolucci, E. Pastorelli, F. Simula, P. Vicini, G. Taffoni, John Goodacree, Mikel Lujn, J. Navaridas, J. P. Saiz, N. Chrysos, and M. Katevenis for the ExaNeSt team

Journal title: Euromicro Conference on Digital System Design (DSD 2017)

Journal publisher: IEEE

Published year: 2017

DOI identifier: 10.5281/zenodo.823595