The ExaNeSt Project: Interconnects, Storage, and Packaging for Exascale Systems

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Authors: M. Katevenis, N. Chrysos, M. Marazakis, I. Mavroidis, F. Chaix, N. Kallimanis, J. Navaridas, J. Goodacre, P. Vicini, A. Biagioni, P. S. Paolucci, A. Lonardo, E. Pastorelli, F. Lo Cicero, R. Ammendola, P. Hopton, P. Coates, G. Taffoni, S. Cozzini, M. Kersten, Y. Zhang, J. Sahuquillo, S. Lechago, C. Pinto, B. Lietzow, D. Everett, G. Perna

Journal title: 2016 Euromicro Conference on Digital System Design (DSD)

Journal publisher: IEEE

Published year: 2016

Published pages: 60-67

DOI identifier: 10.1109/DSD.2016.106

ISBN: 978-1-5090-2817-7