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Authors: Arman Iranfar, Federico Terraneo, Gabor Csordas, Marina Zapater, William Fornaciari, David Atienza
Journal title: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Journal publisher: IEEE
Published year: 2020
Published pages: 418-423
DOI identifier: 10.23919/date48585.2020.9116510
ISBN: 978-3-9819263-4-7