Probabilistic-WCET reliability: Statistical testing of EVT hypotheses

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Authors: Federico Reghenzani, Giuseppe Massari, William Fornaciari

Journal title: Microprocessors and Microsystems

Journal number: 77

Journal publisher: Elsevier BV

Published year: 2020

Published pages: 103135

DOI identifier: 10.1016/j.micpro.2020.103135

ISSN: 0141-9331