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Authors: Tortorella, Yvan; Bertaccini, Luca; Rossi, Davide; Benini, Luca; Conti, Francesco
Journal title: 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Journal publisher: IEEE
Published year: 2022
Published pages: 1099-1102
DOI identifier: 10.23919/date54114.2022.9774759