Running Efficiently CNNs on the Edge Thanks to Hybrid SRAM-RRAM In-Memory Computing

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Authors: Rios, Marco Antonio ; Ponzina, Flavio ; Ansaloni, Giovanni ; Levisse, Alexandre Sébastien Julien ; Atienza Alonso, David

Journal title: Design, Automation and Test in Europe Conference, Virtual Conference and Exhibition (DATE)

Journal publisher: IEEE/ACM

Published year: 2021

DOI identifier: 10.23919/date51398.2021.9474233