Write Termination Circuits for RRAM: A Holistic Approach From Technology to Application Considerations

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Authors: Alexandre Levisse, Marc Bocquet, Marco Rios, Mouhamad Alayan, Mathieu Moreau, Etienne Nowak, Gabriel Molas, Elisa Vianello, David Atienza, Jean-Michel Portal

Journal title: IEEE Access

Journal number: 8

Journal publisher: Institute of Electrical and Electronics Engineers Inc.

Published year: 2020

Published pages: 109297-109308

DOI identifier: 10.1109/access.2020.3000867

ISSN: 2169-3536