Zero-Bias Power-Detector Circuits based on MoS2 Field-Effect Transistors on Wafer-Scale Flexible Substrates

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Authors: Eros Reato, Paula Palacios, Burkay Uzlu, Mohamed Saeed, Annika Grundmann, Zhenyu Wang, Daniel S. Schneider, Zhenxing Wang, Michael Heuken, Holger Kalisch, Andrei Vescan, Alexandra Radenovic, Andras Kis, Daniel Neumaier, Renato Negra, Max C. Lemme

Journal title: Advanced Materials

Journal number: 15214095

Journal publisher: Wiley

Published year: 2022

Published pages: 2108469

DOI identifier: 10.1002/adma.202108469

ISSN: 1521-4095