Analysis of Functional Errors Produced by Long-Term Workload-Dependent BTI Degradation in Ultralow Power Processors

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Authors: Loris Duch, Miguel Peon-Quiros, Pieter Weckx, Alexandre Levisse, Ruben Braojos, Francky Catthoor, David Atienza

Journal title: IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Journal number: 28/10

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2020

Published pages: 2122-2133

DOI identifier: 10.1109/TVLSI.2020.3003471

ISSN: 1063-8210