End-to-End DNN Inference on a Massively Parallel Analog In Memory Computing Architecture

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Authors: Nazareno Bruschi; Giuseppe Tagliavini; Angelo Garofalo; Francesco Conti; Irem Boybat; Luca Benini; Davide Rossi

Journal title: IEEE Design, Automation & Test in Europe Conference & Exhibition 2023

Journal number: 11

Journal publisher: IEEE

Published year: 2023

DOI identifier: 10.23919/date56975.2023.10137208

ISSN: 1558-1101