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Authors: Mohamed Saeed, Ahmed Hamed, Eyyub Baskent, Burkay Uzlu, Zhenxing Wang, Renato Negra
Journal title: 2021 IEEE MTT-S International Microwave Symposium (IMS)
Journal publisher: IEEE
Published year: 2021
DOI identifier: 10.1109/ims19712.2021.9574812
ISBN: 978-1-6654-0307-8