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Authors: Erik H. A. Duisterwinkel, Elena Talnishnikh, Dirkjan Krijnders, Heinrich J. Wortche
Journal title: IEEE Transactions on Instrumentation and Measurement
Journal number: 67/3
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2018
Published pages: 655-666
DOI identifier: 10.1109/TIM.2017.2775404
ISSN: 0018-9456