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Authors: Haoming Xin, Martin Andraud, Peter Baltus, Eugenio Cantatore, Pieter Harpe
Journal title: IEEE Solid-State Circuits Letters
Journal number: 1/3
Journal publisher: IEEE
Published year: 2018
Published pages: 70-73
DOI identifier: 10.1109/lssc.2018.2827883
ISSN: 2573-9603