From on-chip self-healing to self-adaptivity in analog/RF ICs: challenges and opportunities

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Authors: Martin Andraud, Marian Verhelst

Journal title: 2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)

Journal publisher: IEEE

Published year: 2018

Published pages: 131-134

DOI identifier: 10.1109/iolts.2018.8474078

ISBN: 978-1-5386-5992-2