On the use of Bayesian Networks for Resource-Efficient Self-Calibration of Analog/RF ICs

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Authors: Martin Andraud, Laura Galindez, Yichuan Lu, Yiorgos Makris, Marian Verhelst

Journal title: 2018 IEEE International Test Conference (ITC)

Journal publisher: IEEE

Published year: 2018

Published pages: 1-10

DOI identifier: 10.1109/test.2018.8624893

ISBN: 978-1-5386-8382-8