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Authors: A. Jiménez ; A. Datas ; D. Canteli ; D. Muñoz-Martín ; M. Morales ; C. Molpecere
Journal title: 2018 Spanish Conference on Electron Devices (CDE)
Journal publisher: IEEE
Published year: 2018
DOI identifier: 10.1109/cde.2018.8597048
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