Versatile Seebeck and electrical resistivity measurement setup for thin films

Summary

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Authors: Sofia Ferreira-Teixeira; F. Carpinteiro; João P. Araújo; João Borges de Sousa; André Pereira

Journal title: The Review of scientific instruments

Journal number: 3

Journal publisher: American Institute of Physics

Published year: 2021

DOI identifier: 10.1063/5.0036817

ISSN: 0034-6748