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Authors: Feng Li, Yiming Li, L. Giriunas, M. Sich, D. D. Solnyshkov, G. Malpuech, A. A. P. Trichet, J. M. Smith, E. Clarke, M. S. Skolnick, D. N. Krizhanovskii
Journal title: Journal of Applied Physics
Journal number: 131
Journal publisher: American Institute of Physics
Published year: 2022
Published pages: 093101
DOI identifier: 10.1063/5.0076459
ISSN: 0021-8979