Microwave Device Characterization Using a Widefield Diamond Microscope

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Authors: Andrew Horsley, Patrick Appel, Janik Wolters, Jocelyn Achard, Alexandre Tallaire, Patrick Maletinsky, Philipp Treutlein

Journal title: Physical Review Applied

Journal number: 10/4

Journal publisher: Physical Review Applied

Published year: 2018

DOI identifier: 10.1103/physrevapplied.10.044039

ISSN: 2331-7019